Use este identificador para citar ou linkar para este item: http://www.alice.cnptia.embrapa.br/alice/handle/doc/974639
Título: Western bean cutworm survival and the development of economic injury levels and economic thresholds in field corn.
Autoria: MORAES, S. V. de P.
HUNT, T. E.
WRIGHT, R. J.
HEIN, G. L.
BLANKENSHIP, E. E.
Afiliação: SILVANA VIEIRA DE PAULA MORAES, CPAC; UNIVERSITY OF NEBRASKA-LINCOLN; UNIVERSITY OF NEBRASKA-LINCOLN; UNIVERSITY OF NEBRASKA-LINCOLN; UNIVERSITY OF NEBRASKA-LINCOLN.
Ano de publicação: 2013
Referência: Journal of Economic Entomology, College Park, v. 106, n. 3, p. 1274-1285, 2013.
Conteúdo: Western bean cutworm, Striacosta albicosta (Smith) (Lepidoptera: Noctuidae), is a native pest of dry beans (Phaseolus vulgaris L.) and corn (Zea mays L.). Historically, the western bean cutworm was distributed in the western United States, but since 1999 eastward expansion has been observed. In corn, economic impact is caused by larval ear feeding. Information on western bean cutworm biology, ecology, and economic impact is relatively limited, and the development of economic injury levels (EILs) and economic thresholds (ETs) is required for more effective management. Studies during 2008Ð2011, across three ecoregions of Nebraska, sought to characterize western bean cutworm survival and development of EILs and ETs. Calculations of EILs and ETs incorporated the dynamics of corn price, management cost, and pest survival. The results from the current study demonstrated low larval survival of this species (1.51Ð12.82%). The mean yield loss from one western bean cutworm larva per plant was 945.52 kg/ha (15.08 bu/acre), based on 74,100 plants per ha. Economic thresholds are expressed as a percentage of plants with at least one egg mass. This study is the Þrst study that explicitly incorporates variable management costs and crop values into western bean cutworm EIL calculations, and larval survival into ET calculations.
Thesagro: Lagarta
Praga de planta
Feijão
Milho
Lagarta rosca
NAL Thesaurus: Richia albicosta
Biological resistance
Larval development
Economic threshold
Pests
Corn
United States
Palavras-chave: Resistência larval
Nivel de dano ecônomico
Western bean cutworm
Striacosta albicosta
Bean
Digital Object Identifier: http://dx.doi.org/10.1603/EC12436
Tipo do material: Artigo de periódico
Acesso: openAccess
Aparece nas coleções:Artigo em periódico indexado (CPAC)

Arquivos associados a este item:
Arquivo Descrição TamanhoFormato 
33774.pdf172,71 kBAdobe PDFThumbnail
Visualizar/Abrir

FacebookTwitterDeliciousLinkedInGoogle BookmarksMySpace