Please use this identifier to cite or link to this item: http://www.alice.cnptia.embrapa.br/alice/handle/doc/994232
Title: Modeling sugar cane yield with a process-based model from site to continental scale: uncertainties arising from model structure and parameter values.
Authors: VALADE, A.
CIAIS, P.
VUICHARD, N.
VIOVY, N.
CAUBEL, A.
HUTH, N.
MARIN, F. R.
MARTINÉ, J.-F.
Affiliation: LSCE, CEA-CNRS; LSCE, CEA-CNRS; LSCE, CEA-CNRS; LSCE, CEA-CNRS; LSCE, CEA-CNRS; CSIRO; FABIO RICARDO MARIN, CNPTIA; Cirad.
Date Issued: 2014
Citation: Geoscientific Model Development, Gottingen, v. 7, p. 1225-1245, 2014.
Description: This study reveals the spatial and temporal patterns of uncertainty variability for a highly parameterized agro-LSM and calls for more systematic uncertainty analyses of such models.
NAL Thesaurus: Sugarcane
Models
Keywords: Modelagem
Modelos
Cana-de-açúcar
DOI: 10.5194/gmdd-7-1-2014
Type of Material: Artigo de periódico
Access: openAccess
Appears in Collections:Artigo em periódico indexado (CNPTIA)

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