Use este identificador para citar ou linkar para este item: http://www.alice.cnptia.embrapa.br/alice/handle/doc/1066012
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dc.contributor.authorMONDO, V. H. V.pt_BR
dc.contributor.authorNASCENTE, A. S.pt_BR
dc.contributor.authorCARDOSO NETO, M. O.pt_BR
dc.date.accessioned2017-03-03T11:11:11Zpt_BR
dc.date.available2017-03-03T11:11:11Zpt_BR
dc.date.created2017-03-03pt_BR
dc.date.issued2016pt_BR
dc.identifier.citationJournal of Seed Science, Londrina, v. 38, n. 4, p. 365-370, out./dez. 2016.pt_BR
dc.identifier.issn2317-1545pt_BR
dc.identifier.urihttp://www.alice.cnptia.embrapa.br/alice/handle/doc/1066012pt_BR
dc.descriptionAmong the factors that affect seedling emergence and crop establishment are seed germination and vigor, which has an important influence on the establishment of the initial plant population and development, and may affect crop yield. Based on this background the objective of this research work was to evaluate the effects of seed vigor of common bean seed lots and its effects on crop grain yield. The treatments consisted of six seed lots of common bean, which were composed by different combinations of high and low vigor seeds. Seed lots were assessed by germination and vigor tests (first count of germination, electrical conductivity and accelerated aging). A field experiment was conducted in a randomized block design, with plots of six lines of five meters and were evaluated for grain yield at harvest. It was concluded that seed vigor affects common bean grain yield; the use of low vigor seeds results in grain yield reductions of up to 20%.pt_BR
dc.language.isoengeng
dc.rightsopenAccesseng
dc.subjectAnálise de sementept_BR
dc.titleCommon bean seed vigor affecting crop grain yield.pt_BR
dc.typeArtigo de periódicopt_BR
dc.date.updated2017-03-03T11:11:11Zpt_BR
dc.subject.thesagroFeijãopt_BR
dc.subject.thesagroPhaseolus vulgarispt_BR
dc.subject.thesagroSementept_BR
dc.subject.thesagroProdutividadept_BR
riaa.ainfo.id1066012pt_BR
riaa.ainfo.lastupdate2017-03-03pt_BR
dc.identifier.doi10.1590/2317-1545v38n4166814pt_BR
dc.contributor.institutionVITOR HENRIQUE VAZ MONDO, CNPAF; ADRIANO STEPHAN NASCENTE, CNPAF; MANOEL OLIVEIRA CARDOSO NETO, UNI-ANHANGUERA.pt_BR
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