Please use this identifier to cite or link to this item: http://www.alice.cnptia.embrapa.br/alice/handle/doc/927428
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dc.contributor.authorSTEFFENS, C.
dc.contributor.authorLEITE, F. L.
dc.contributor.authorBUENO, C. C.
dc.contributor.authorMANZOLI, A.
dc.contributor.authorHERRMANN JUNIOR, P. S. de P.
dc.date.accessioned2018-09-13T00:35:25Z-
dc.date.available2018-09-13T00:35:25Z-
dc.date.created2012-06-29
dc.date.issued2012
dc.identifier.citationSensors, Basel, v. 12, p. 8278-8300, 2012.
dc.identifier.issn1424-8220
dc.identifier.urihttp://www.alice.cnptia.embrapa.br/alice/handle/doc/927428-
dc.language.isoengeng
dc.rightsopenAccesseng
dc.subjectAtomic force spectroscopy
dc.subjectNanotecnology
dc.subjectNanosensors
dc.titleAtomic force microscopy as a tool applied to nano/biosensors.
dc.typeArtigo de periódico
dc.date.updated2018-09-13T00:35:25Zpt_BR
dc.subject.nalthesaurusAtomic force microscopy
riaa.ainfo.id927428
riaa.ainfo.lastupdate2018-09-12
dc.identifier.doi10.3390/s120608278
dc.contributor.institutionPAULO SERGIO DE P HERRMANN JUNIOR, CNPDIA.
Appears in Collections:Artigo em periódico indexado (CNPDIA)

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