Please use this identifier to cite or link to this item: http://www.alice.cnptia.embrapa.br/alice/handle/doc/1092562
Title: Semi-automatic method for evaluating aphid-resistant wheat genotypes using image analysis.
Authors: LAU, D.
PEREIRA, P. R. V. da S.
LINS, E. A.
RIEDER, R.
PIVATO, J.
SCARPARO, A. P.
LIMA, M. B.
FERNANDES, J. M. C.
Affiliation: DOUGLAS LAU, CNPT; PAULO ROBERTO VALLE DA S PEREIRA, CNPT; ELISON A. LINS; RAFAEL RIEDER; JULIANA PIVATO; ANA P. SCARPARO; MARILIA B. LIMA; JOSE MAURICIO CUNHA FERNANDES, CNPT.
Date Issued: 2018
Citation: In: INTERNATIONAL PLANT RESISTANCE TO INSECTS SYMPOSIUM, 23., 2018, Harpenden. [Abstracts...]. Harpenden: Rothamsted Research, 2018.
Pages: p. 44.
Thesagro: Afídeo
Trigo
Doença de Planta
NAL Thesaurus: Barley yellow dwarf virus
Plant diseases and disorders
Keywords: Vírus do nanismo Amarelo da cevada
BYDV
Notes: Oral presentations.
Type of Material: Resumo em anais e proceedings
Access: openAccess
Appears in Collections:Resumo em anais de congresso (CNPT)

Files in This Item:
File Description SizeFormat 
ID443452018IPRIp44.pdf673,85 kBAdobe PDFThumbnail
View/Open

FacebookTwitterDeliciousLinkedInGoogle BookmarksMySpace