Título:	X-ray microtomography to investigate thin layers of soil clod.
Autoria:	MACEDO, A. CRESTANA, S. VAZ, C. M. P.
Ano de publicação:	1998
Referência:	Soil & tillage research, Amsterdam, v. 49, p. 249-253, 1998.
Conteúdo:	In this paper we present an equipment and a methodology for soil non-invasive investigation at the microscale. We developed a micrometric scale tomograph to work at a resolution of at least 100 μm. A microtomography of 1 mm sand grains and 1 mm grass roots is presented. Inside one of the grains, a crack 110 μm wide per 460 μm long can be observed. Pores of 100 μm can be studied. A microtomography of a little soil clod is shown, in which grains of densities up to 4.5 g cm−3 can be seen. Pores ranging from 200 to 800 μm can also be detected in the tomography. As an example of the potential of the method and equipment, soil crusting and sealing can be observed in a natural sample in soil investigations. The image shows three layers of different densities and soil textures. The thicknesses of the layers from top to bottom are, respectively, 1000, 500 and 1700 μm.
Palavras-chave:	Microtomografia de raios X (Micro-CT) Tomografia computadorizada de raios X (CT) Imagens 3D
Tipo do material:	Artigo de periódico
Acesso:	openAccess
Aparece nas coleções:	Artigo em periódico indexado (CNPDIA)